【Notification of Manufacturer Change for Panasonic Industrial Devices SUNX Products and Panasonic Industrial Devices SUNX Tatsuno Products】
From April 1, 2024, the terms "Panasonic Industrial Devices SUNX Co., Ltd." and "Panasonic Industrial Devices SUNX Tatsuno Co., Ltd."
in this page and in the manuals and other documents to be downloaded will all be replaced with "Panasonic Industry Co., Ltd." and applied accordingly.

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Robust Photoelectric Sensor RX (Discontinued Products)

Sensing characteristics

*TYPICAL

All models

Correlation between setting distance and excess gain

All models Correlation between setting distance and excess gain



All models Correlation between setting distance and excess gain
All models Correlation between setting distance and excess gain

RX-M10

Thru-beam type

Parallel deviation


RX-M10 Parallel deviation

Parallel deviation with slit masks
(0.5 × 5 mm 0.020 × 0.197 in)

RX-M10 Parallel deviation with slit masks (0.5 × 5 mm 0.020 × 0.197 in)

Parallel deviation with slit masks
(1 × 5 mm 0.039 × 0.197 in)

RX-M10 Parallel deviation with slit masks (1 × 5 mm 0.039 × 0.197 in)

Parallel deviation with slit masks
(3 × 5 mm 0.118 × 0.197 in)

RX-M10 Parallel deviation with slit masks (3 × 5 mm 0.118 × 0.197 in)

RX-M50

Thru-beam type

Parallel deviation

RX-M50 Parallel deviation

RX-RVM5

Retroreflective type

Parallel deviation

RX-RVM5 Parallel deviation

RX-D700

Diffuse reflective type

Sensing field

RX-D700 Sensing field

Correlation between sensing object size and sensing range

RX-D700 Sensing field

As the sensing object size becomes smaller than the standard size (white non-glossy paper 200 × 200 mm 7.874 × 7.874 in), the sensing range shortens, as shown in the left graph.
(For plotting the left graph, the sensitivity has been set such that a 200 × 200 mm 7.874 × 7.874 in white non-glossy paper is just detectable at a distance of 700 mm 27.559 in.)

RX-M2R

Thru-beam type

Parallel deviation

RX-M2R Parallel deviation

RX-500G

Thru-beam type

Parallel deviation

RX-500G Parallel deviation

RX4-M5□

Thru-beam type

Parallel deviation

RX4-M5□ Parallel deviation

RX2-M5

Thru-beam type

Parallel deviation


RX2-M5 Parallel deviation

Parallel deviation with slit masks
(0.5 × 5 mm 0.020 × 0.197 in)

RX2-M5 Parallel deviation with slit masks (0.5 × 5 mm 0.020 × 0.197 in)

Parallel deviation with slit masks
(1 × 5 mm 0.039 × 0.197 in)

RX2-M5 Parallel deviation with slit masks (1 × 5 mm 0.039 × 0.197 in)

Parallel deviation with slit masks
(3 × 5 mm 0.118 × 0.197 in)

Parallel deviation with slit masks (3 × 5 mm 0.118 × 0.197 in)

RX-PRVM3

Retroreflective type

Parallel deviation

RX-PRVM3 Parallel deviation

RX2-PRVM2

Retroreflective type

Parallel deviation

RX2-PRVM2 Parallel deviation

RX-D200R

Diffuse reflective type

Sensing field

RX-D200R Sensing field

Correlation between sensing object size and sensing range

RX-D200R Correlation between sensing object size and sensing range

As the sensing object size becomes smaller than the standard size (white non-glossy paper 200 × 200 mm 7.874 × 7.874 in), the sensing range shortens, as shown in the left graph.
(For plotting the left graph, the sensitivity has been set such that a 200 × 200 mm 7.874 × 7.874 in white non-glossy paper is just detectable at a distance of 200 mm 7.874 in.)

RX2-D300

Diffuse reflective type

Sensing field

RX2-D300 Sensing field

Correlation between sensing object size and sensing range

RX2-D300 Correlation between sensing object size and sensing range

As the sensing object size becomes smaller than the standard size (white non-glossy paper 200 × 200 mm 7.874 × 7.874 in), the sensing range shortens, as shown in the left graph.
(For plotting the left graph, the sensitivity has been set such that a 200 × 200 mm 7.874 × 7.874 in white non-glossy paper is just detectable at a distance of 300 mm 11.811 in.)

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